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INFRARED INTERFERENCE METHOD THICKNESS GAUGE
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  • INFRARED INTERFERENCE METHOD THICKNESS GAUGE

INFRARED INTERFERENCE METHOD THICKNESS GAUGE

The optical infrared interference thickness gauge newly developed and produced by our company can measure the thickness of the coated substrate and coating layer by layer using the self-developed measuring probe and self-developed software algorithm.
Product classification:

Infrared Interference Method Thickness Gauge

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Email:

frank.zhou@gzboltzmann.com

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  • Description

  • Product Description

    The optical infrared interference thickness gauge newly developed and produced by our company can measure the thickness of the coated substrate and coating layer by layer using the self-developed measuring probe and self-developed software algorithm.

     

    TECHNICAL PARAMETER
    Measurement accuracy 0.01um
    Measuring range 15nm-100um
    Still resolution 0.016um
    Dynamic measurement accuracy ±0.1%
    Light spot diameter φ100um
    Sampling frequency 10ms
    Ambient temperature range 0 - 50℃

     

    Scope Of Application

     

    Product Advantages

    1.PROBE：The independently developed probe is stable, reliable and high precision.

    2.SCANNER：It is made of integrally bent steel plate, which is not easy to be deformed, and has a fully enclosed design.

    3.DRIVE：Using high-precision servo motor, high positioning accuracy, good repeatability, speed closed-loop control function.

    4.COMMUNICATION：Ethercat is used for real-time network communication without delay, and the signal sampling period is 10ms. When several thickness gauges do the same point measurement, ensure that the scanning paths of several thickness gauges are exactly the same.

    5.DIFFERENCE ALGORITHM：The interferometer adopts advanced FFT algorithm, and the response speed reaches 10ms.

     

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